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Proceedings Paper

The polishing detection method of side-polished fiber
Author(s): Yaxun Zhang; Lei Wang; Zhihai Liu
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Paper Abstract

Micro crack and pits of Side-polished fiber (SPF) is polished by fine sand paper and by an arc discharge, and their effects are compared. When there is no light through SPF after polishing, we will find that using an arc discharge method is better than fine sand paper polishing method especially their images being compared. When light passes SPF after polishing, we will find that transmitted light of SPF by using an arc discharge method is less than the others. In conclusion, using an arc discharge method is obviously better than fine sand paper polishing method.

Paper Details

Date Published: 28 November 2011
PDF: 8 pages
Proc. SPIE 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology, 820211 (28 November 2011); doi: 10.1117/12.906590
Show Author Affiliations
Yaxun Zhang, Harbin Engineering Univ. (China)
Lei Wang, Harbin Engineering Univ. (China)
Zhihai Liu, Harbin Engineering Univ. (China)


Published in SPIE Proceedings Vol. 8202:
2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology
Hoi Sing Kwok; Fengzhou Fang; Lian Xiang Yang; Chongxiu Yu; Albert A. Weckenmann; Yanbing Hou; Jinxue Wang; Ji Zhao; Jinxue Wang; Peter Zeppenfeld; Boyu Ding; Boyu Ding; Liquan Dong; Liquan Dong; Jack K. Luo; Boyu Ding; Liquan Dong; Jinxue Wang, Editor(s)

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