Share Email Print
cover

Proceedings Paper

Measuring and traceable methods of spectral irradiance and ultraviolet irradiance
Author(s): Bo Huang; Caihong Dai; Jailin Yu; Zhifeng Wu; Huiquan Ouyang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper mainly discusses the measuring and traceable methods of spectral irradiance and ultraviolet irradiance in order to advance the accuracy of the two quantities. The contents include: 1.The working principal of the primary standard apparatus of spectral irradiance and spectral radiance and the value transferring methods of spectral irradiance. 2. The traceable methods of ultraviolet irradiance to spectral irradiance primary standard apparatus. 3. Introduce the international comparison of spectral irradiance and the comparison of irradiance responsivity of UV detectors. 4. The influence factors that decrees measuring accuracy of UV radiometer and the capability evaluated methods. We put forward a fitting function of spectral irradiance of standard lamp and an optimizing method for parameters. The relative deviation of the fitting function is acceptable comparing to the uncertainty of national primary standard of spectral irradiance lamp. We also defined evaluated capabilities of UV radiometers to reflect the instrument condition and promote measuring accuracy.

Paper Details

Date Published: 30 November 2011
PDF: 12 pages
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011Z (30 November 2011); doi: 10.1117/12.906515
Show Author Affiliations
Bo Huang, National Institute of Metrology (China)
Caihong Dai, National Institute of Metrology (China)
Jailin Yu, National Institute of Metrology (China)
Zhifeng Wu, National Institute of Metrology (China)
Huiquan Ouyang, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 8201:
2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Xinyong Dong; Xiaoyi Bao; Perry Ping Shum; Tiegen Liu, Editor(s)

© SPIE. Terms of Use
Back to Top