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Proceedings Paper

Simulations of diagnostic spectrometers for the European XFEL using the ray-trace tool RAY
Author(s): Jens Rehanek; Franz Schäfers; Alexei Erko; Michael Scheer; Wolfgang Freund; Jan Grünert; Cigdem Ozkan; Serguei Molodtsov
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Paper Abstract

This paper presents the outcome of ray tracing simulations for different optical schemes to be setup at the European X-ray Free Electron Laser facility (XFEL.EU), Germany: one- or two- channel (cut) crystal X-ray monochromators (K-Mono; using spontaneous radiation) are planned and designed mainly for photon beam based alignment, which is gap tuning of the undulator segments and phase tuning of the phase shifters during commissioning and maintenance of the undulators. The coherent SASE (Self Amplified Spontaneous Emission) radiation will be monitored pulse-resolved by single-shot spectrometers of which two types are investigated: i) a three element spectrometer, design proposed by Yabashi et al., which consists of a curved focusing mirror, followed by a flat analyzer crystal and a 2D-detector.ii) a two element spectrometer based on a reflection zone plate that reflects and focuses in one step, and a 2D-detector (currently under development).

Paper Details

Date Published: 23 September 2011
PDF: 15 pages
Proc. SPIE 8141, Advances in Computational Methods for X-Ray Optics II, 814109 (23 September 2011); doi: 10.1117/12.906038
Show Author Affiliations
Jens Rehanek, Helmholtz-Zentrum Berlin (Germany)
Franz Schäfers, Helmholtz-Zentrum Berlin (Germany)
Alexei Erko, Helmholtz-Zentrum Berlin (Germany)
Michael Scheer, Helmholtz-Zentrum Berlin (Germany)
Wolfgang Freund, European XFEL GmbH (Germany)
Jan Grünert, European XFEL GmbH (Germany)
Cigdem Ozkan, European XFEL GmbH (Germany)
Serguei Molodtsov, European XFEL GmbH (Germany)

Published in SPIE Proceedings Vol. 8141:
Advances in Computational Methods for X-Ray Optics II
Manuel Sanchez del Rio; Oleg Chubar, Editor(s)

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