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Proceedings Paper

Micro-optical system based 3D imaging for full HD depth image capturing
Author(s): Yong-Hwa Park; Yong-Chul Cho; Jang-Woo You; Chang-Young Park; Heesun Yoon; Sang-Hun Lee; Jong-Oh Kwon; Seung-Wan Lee
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Paper Abstract

20 Mega-Hertz-switching high speed image shutter device for 3D image capturing and its application to system prototype are presented. For 3D image capturing, the system utilizes Time-of-Flight (TOF) principle by means of 20MHz high-speed micro-optical image modulator, so called 'optical shutter'. The high speed image modulation is obtained using the electro-optic operation of the multi-layer stacked structure having diffractive mirrors and optical resonance cavity which maximizes the magnitude of optical modulation. The optical shutter device is specially designed and fabricated realizing low resistance-capacitance cell structures having small RC-time constant. The optical shutter is positioned in front of a standard high resolution CMOS image sensor and modulates the IR image reflected from the object to capture a depth image. Suggested novel optical shutter device enables capturing of a full HD depth image with depth accuracy of mm-scale, which is the largest depth image resolution among the-state-of-the-arts, which have been limited up to VGA. The 3D camera prototype realizes color/depth concurrent sensing optical architecture to capture 14Mp color and full HD depth images, simultaneously. The resulting high definition color/depth image and its capturing device have crucial impact on 3D business eco-system in IT industry especially as 3D image sensing means in the fields of 3D camera, gesture recognition, user interface, and 3D display. This paper presents MEMS-based optical shutter design, fabrication, characterization, 3D camera system prototype and image test results.

Paper Details

Date Published: 15 February 2012
PDF: 15 pages
Proc. SPIE 8252, MOEMS and Miniaturized Systems XI, 82520X (15 February 2012); doi: 10.1117/12.905946
Show Author Affiliations
Yong-Hwa Park, Samsung Advanced Institute of Technology (Korea, Republic of)
Yong-Chul Cho, Samsung Advanced Institute of Technology (Korea, Republic of)
Jang-Woo You, Samsung Advanced Institute of Technology (Korea, Republic of)
Chang-Young Park, Samsung Advanced Institute of Technology (Korea, Republic of)
Heesun Yoon, Samsung Advanced Institute of Technology (Korea, Republic of)
Sang-Hun Lee, Samsung Advanced Institute of Technology (Korea, Republic of)
Jong-Oh Kwon, Samsung Advanced Institute of Technology (Korea, Republic of)
Seung-Wan Lee, Samsung Advanced Institute of Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 8252:
MOEMS and Miniaturized Systems XI
Harald Schenk; Wibool Piyawattanametha; Wilfried Noell, Editor(s)

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