Share Email Print
cover

Proceedings Paper

Coherence-gated wavefront sensing for microscopy using fringe analysis
Author(s): Tim van Werkhoven; Hoa Truong; Jacopo Antonello; Rufus Fraanje; Hans Gerritsen; Michel Verhaegen; Christoph Keller
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We have implemented a coherence-gated wavefront sensor on a two-photon excitation microscope. We used the backscattered near-infrared light from the sample to interfere with an optically flat reference beam. By applying a known waverfront tilt in the reference beam, a fringe pattern emerged on the camera. The deformmation of the wavefront due to the turbid media under study warps the fring pattern, similar to frequency modulation. Through Fourier transform analysis of the modulated fringe pattern we were able to determine the wave fornt aberrations induced by synthetic and biological samples. By defocussing the microscope objective and measuring the wavefront deformation we established that the errors are reproduceible to within λ/227 for the defocus mode.

Paper Details

Date Published: 16 February 2012
PDF: 7 pages
Proc. SPIE 8253, MEMS Adaptive Optics VI, 82530E (16 February 2012); doi: 10.1117/12.905797
Show Author Affiliations
Tim van Werkhoven, Leiden Univ. (Netherlands)
Utrecht Univ. (Netherlands)
Hoa Truong, Utrecht Univ. (Netherlands)
Jacopo Antonello, Technische Univ. Delft (Netherlands)
Rufus Fraanje, Technische Univ. Delft (Netherlands)
Hans Gerritsen, Utrecht Univ. (Netherlands)
Michel Verhaegen, Technische Univ. Delft (Netherlands)
Christoph Keller, Leiden Univ. (Netherlands)
Utrecht Univ. (Netherlands)


Published in SPIE Proceedings Vol. 8253:
MEMS Adaptive Optics VI
Scot S. Olivier; Thomas G. Bifano; Joel Kubby, Editor(s)

© SPIE. Terms of Use
Back to Top