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Proceedings Paper

Precision measurement facility of mid-infrared spectral emissivity measurement
Author(s): Guojin Feng; Tingliang Guo
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Paper Abstract

Based on Fourier infrared spectrometer, the mid-infrared normal spectral emissivity measurement device with high accuracy was developed in Spectrophotometry Laboratory, National Institute of Metrology, China. It was composed of Fourier infrared spectrometer, black body, heater and the auxiliary optical components. It can work at 100 to 450°C with heating function and can work at up to 1100°C only for self-heating materials or systems. The measurement wavelength range covers the whole middle infrared light 2.5-25um, and the measurement uncertainty is better than 2%(k=2) at any measurement temperature point for self-heating materials or systems.

Paper Details

Date Published: 5 December 2011
PDF: 6 pages
Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 819714 (5 December 2011); doi: 10.1117/12.905503
Show Author Affiliations
Guojin Feng, National Institute of Metrology (China)
Tingliang Guo, Huaihai Institute of Technology (China)


Published in SPIE Proceedings Vol. 8197:
2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Han-Ping Shieh; Kimio Tatsuno, Editor(s)

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