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Proceedings Paper

The simulation research of multi-core optical fiber near-field optical tweezers
Author(s): Guohua Hou; Zhihai Liu
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Paper Abstract

In order to develop the near- field optical tweezers with perfect function , We design the near-field optical fiber optical tweezers basing on the multi-core of the optical fiber. Combining the total internal reflection and multi-core optical fiber, we form evanescent wave on the fiber water interface forming , and realize the capture of object .It can separate the near-field optical tweezers and its control from the microscopic observation system effectively, so It enhance the operability of near-field optical tweezers and the ability of active capture greatly. The Multi-core optical fiber constitutes the Near-field optical tweezers, the superposition of the coherent light from opposite transmission forms a area of capture. Interference effect makes light intensely, at the same time the capture space becomes more and more narrow. They can improve the capture function of the new generation of all-fiber near-field optical tweezers greatly. And we quantitatively calculating the optical trap force of the micron-grade particle. In this passage, there is a new progress in setting up the near field optical tweezers' model and the calculation method. Moreover, it improves the using value of the near field optical tweezers technology in the life sciences.

Paper Details

Date Published: 29 November 2011
PDF: 8 pages
Proc. SPIE 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology, 82020K (29 November 2011); doi: 10.1117/12.905308
Show Author Affiliations
Guohua Hou, Harbin Engineering Univ. (China)
Zhihai Liu, Harbin Engineering Univ. (China)


Published in SPIE Proceedings Vol. 8202:
2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology
Hoi Sing Kwok; Fengzhou Fang; Lian Xiang Yang; Chongxiu Yu; Albert A. Weckenmann; Yanbing Hou; Jinxue Wang; Ji Zhao; Jinxue Wang; Peter Zeppenfeld; Boyu Ding; Boyu Ding; Liquan Dong; Liquan Dong; Jack K. Luo; Boyu Ding; Liquan Dong; Jinxue Wang, Editor(s)

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