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Proceedings Paper

Evaluation method for one-dimensional assembly yield based on Taguchi orthogonal experiment
Author(s): Zejun Wen; Zhengqiang Zhu; Zhijin Zhou; Shuyi Yang
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Paper Abstract

Evaluation method for one-dimensional assembly yield is presented based on Taguchi orthogonal experiment. Firstly, according to Taguchi parameter design criteria, component loop sizes are taken for factors of Taguchi orthogonal experiment, each factor is divided into three levels. After approriate orthogonal experiment table is selected, orthogonal experiment is operated. Then the mean and standard deviation of close loop size are solved, which are used to obtain assembly yield. The influence on assembly yield of each factor is analyzed by using extreme value method and the results are validated by using Monte Carlo simulation. Finally, a gear components assembly is provided to illustrate the effectiveness of the presented method .It has a guiding significance for machanical assembly design.

Paper Details

Date Published: 15 November 2011
PDF: 6 pages
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832136 (15 November 2011); doi: 10.1117/12.905244
Show Author Affiliations
Zejun Wen, Hunan Univ. of Science and Technology (China)
Zhengqiang Zhu, Hunan Univ. of Science and Technology (China)
Zhijin Zhou, Hunan Univ. of Science and Technology (China)
Shuyi Yang, Hunan Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8321:
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Kuang-Chao Fan; Man Song; Rong-Sheng Lu, Editor(s)

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