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Proceedings Paper

Research on the pattern evaluation in the digital speckle pattern interferometry
Author(s): Yonghong Wang; Nan Li; Hualong Zhou; Jianfei Sun; Lianxiang Yang
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Paper Abstract

Digital Speckle Pattern Interferometry (DSPI) is one of modern optical measurement techniques. It has the advantage of non-contacting, whole field, high measurement accuracy and without special process of the surface to be measured. With the development of computer science and electronics, DSPI is used more and more widely. This paper systematically presents the principle of speckles and measurements by DSPI. Optical measurement system based on DSPI was built for demonstrate. In order to quantitative determination of the distribution of phase change, several imaging process and pattern evaluation methods are discussed and compared. Phase shifting techniques and phase pattern filter methods also were described in detail. In this paper, some experiments results were given, which clearly demonstrate that that the methods are effective for processing pattern.

Paper Details

Date Published: 15 November 2011
PDF: 6 pages
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212W (15 November 2011); doi: 10.1117/12.905196
Show Author Affiliations
Yonghong Wang, Hefei Univ. of Technology (China)
Nan Li, Hefei Univ. of Technology (China)
Hualong Zhou, Hefei Univ. of Technology (China)
Jianfei Sun, Hefei Univ. of Technology (China)
Lianxiang Yang, Hefei Univ. of Technology (China)
Oakland Univ. (United States)

Published in SPIE Proceedings Vol. 8321:
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Kuang-Chao Fan; Man Song; Rong-Sheng Lu, Editor(s)

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