Share Email Print
cover

Proceedings Paper

The SRI method based on the optical frequency comb on absolute distance measurement
Author(s): Yan Xu; Weihu Zhou; Deming Liu; Lei Ding
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A novel absolute distance measurement method based on the optical frequency comb of the Ti:sapphire femtosecond laser was presented. In the spectrally-resolved interferometry (SRI), all modes interference signals of the optical frequency comb was obtained by the femtosecond light pulses traveling along different optical path between the reference and measurement arms. The interference intensity in the frequency domain was inverse Fourier-transformed into the time domain, and the phase peak was isolated by use of an appropriate Hamming window, then the phase difference which was caused by the distance was resolved in the frequency domain. The simulation results indicated that this algorithm could satisfy the demand of the small scale profile measurement with the non-ambiguity range of millimeter level, and the resolution of nanometer level. Furthermore, combined with the conventional phase ranging method, the max measurement distance of our method can be extended to several dozen meters.

Paper Details

Date Published: 30 November 2011
PDF: 6 pages
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011L (30 November 2011); doi: 10.1117/12.905019
Show Author Affiliations
Yan Xu, Huazhong Univ. of Science and Technology (China)
Jiangxi Univ. of Science and Technology, (China)
Academy of Opto-Electronics (China)
Weihu Zhou, Academy of Opto-Electronics (China)
Deming Liu, Huazhong Univ. of Science and Technology (China)
Lei Ding, Academy of Opto-Electronics (China)


Published in SPIE Proceedings Vol. 8201:
2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Xinyong Dong; Xiaoyi Bao; Perry Ping Shum; Tiegen Liu, Editor(s)

© SPIE. Terms of Use
Back to Top