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Proceedings Paper

Optical and electro-optic properties of potassium lithium tantalate niobate single crystals
Author(s): Yang Li; Jun Li; Zhongxiang Zhou; Amar Bhalla; Ruyan Guo
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Paper Abstract

Potassium lithium tantalate niobate single crystals with the composition of K0.95Li0.05Ta1-x NbxO3 (KLTN) 0.4<x<0.9, have been grown using the top seeded melt growth method. The dielectric, pyroelectric, and piezoelectric properties have been systematically investigated earlier to establish the quality of the crystals. Using the minimum deviation method the indices of refraction as a function of frequency at room temperature and the Sellmeier's dispersion parameters are determined. The Sénarmont compensator method and a modified Mach-Zehnder interferometer configuration were coupled with computer interfaced dynamic scanning to measure the linear (Pockels') electrooptic coefficients. Large electro-optic responses are obtained for the crystal with K 0.95Li0.05Ta0.4Nb0.6O3 composition at 1kHz: r33 =216.7 [pm/V], r13 = -21.2 [pm/V], and rC= 242.9 [pm/V]. The high EO coefficients, high figure of merit (as EO modulator), and high laser damage threshold are some of the attractive features for their attractive applications as electro-mechanical-optical coupled devices.

Paper Details

Date Published: 16 September 2011
PDF: 8 pages
Proc. SPIE 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V, 81201S (16 September 2011); doi: 10.1117/12.904988
Show Author Affiliations
Yang Li, Harbin Institute of Technology (China)
The Univ. of Texas at San Antonio (United States)
Jun Li, Harbin Institute of Technology (China)
The Univ. of Texas at San Antonio (United States)
Zhongxiang Zhou, Harbin Institute of Technology (China)
Amar Bhalla, The Univ. of Texas at San Antonio (United States)
Ruyan Guo, The Univ. of Texas at San Antonio (United States)


Published in SPIE Proceedings Vol. 8120:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V
Shizhuo Yin; Ruyan Guo, Editor(s)

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