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Proceedings Paper

Spatial separation on the reflected intensity of electromagnetic wavepackets in single film structure
Author(s): Yuan Zhao; Ming-Yu Sheng
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Paper Abstract

The spatial effect of the interference of electromagnetic wave packet has been analyzed for the film structure considering the spatial separation among the multiple reflections. The reflected intensity of polarized electromagnetic wave packet is different considering with and without spatial separation effect. There is significant difference occurred between the situations of the interference with or without consideration of the spatial effect. When the phase delay δ = nπ (n∈1-6). It will be reasonable to obtain the reflected intensity by neglecting the spatial separation only for the thinner film with the thickness much smaller than the wavelength accompanied with the condition to satisfy that δ < π, otherwise, the intensity equation used for the periodic or non-periodic structures will be modified by including the spatial separation in the data analysis and applications.

Paper Details

Date Published: 29 November 2011
PDF: 6 pages
Proc. SPIE 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology, 82020U (29 November 2011); doi: 10.1117/12.904821
Show Author Affiliations
Yuan Zhao, Shanghai Second Polytechnic Univ. (China)
Ming-Yu Sheng, Univ. of Shanghai for Science and Technology (China)
Shanghai Business School (China)


Published in SPIE Proceedings Vol. 8202:
2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology
Hoi Sing Kwok; Fengzhou Fang; Lian Xiang Yang; Chongxiu Yu; Albert A. Weckenmann; Yanbing Hou; Jinxue Wang; Ji Zhao; Jinxue Wang; Peter Zeppenfeld; Boyu Ding; Boyu Ding; Liquan Dong; Liquan Dong; Jack K. Luo; Boyu Ding; Liquan Dong; Jinxue Wang, Editor(s)

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