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Proceedings Paper

Effect of plane height and incident angle of structure laser on measurement of step-style work piece based on computer-vision
Author(s): Bixi Yan; Lishuang Liu; Wenyi Deng; Naiguang Lu; Min Zong
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Paper Abstract

Based on computer-vision technology, the paper studies the effect of plane height error and structure laser incident angle on the measurement of step-style work piece, which has geometric dimensions on different planes. Through the calibration, the relationship of different heights corresponding to two-dimensional plane calibration parameters is established, and the effect of the error of the plane height in the measurement is analyzed, the experiment result demonstrates that when the error of the height is less than 0.1mm, the effect is trivial to the dimension measurement result; The paper also studies the influence of the structure laser incident angle on the measurement. The result of experiments shows that with the increase of the structure laser incident angle, intercept value of any two contour lines which are formed by the incident laser corresponding to two different heights on measured work piece decreases and the world coordinates offset increases but the absolute error is trivial too when the incident angle varies from 30° to 60°.

Paper Details

Date Published: 15 November 2011
PDF: 6 pages
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211E (15 November 2011); doi: 10.1117/12.904162
Show Author Affiliations
Bixi Yan, Beijing Information Science and Technology Univ. (China)
Lishuang Liu, Beijing Information Science and Technology Univ. (China)
Wenyi Deng, Beijing Information Science and Technology Univ. (China)
Naiguang Lu, Beijing Information Science and Technology Univ. (China)
Min Zong, Beijing Information Science and Technology Univ. (China)


Published in SPIE Proceedings Vol. 8321:
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Kuang-Chao Fan; Man Song; Rong-Sheng Lu, Editor(s)

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