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Proceedings Paper

Evaluation of surface control and durability CNT and ITO coated PET transparent electrode under different dry conditions
Author(s): Joung-Man Park; Dong-Jun Kwon; Zuo-Jia Wang; Ga-Young Gu; Lawrence DeVries
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Paper Abstract

Transparent electrodes using carbon nanotube (CNT) have recently been studied as potential replacements for convention ITO. In this work, CNT or ITO coated polyethylene terephthalate (PET) samples were prepared and studied. The degree of cohesion is dependent on the drying conditions. To explore effects of changing surface conditions, three drying temperatures, 20 °C, 80 °C, and 120 °C, were used. Electrical resistance measures were used to evaluate the interfacial durability and electrical properties of prepared transparent electrodes. FE-SEM was used to investigate surface changes and UV-spectroscopy was used to evaluate transparency as functions of the different drying temperatures. The electronic properties for these nanoparticle coated surfaces were evaluated using a cyclic voltametry method. Interfacial durability was evaluated by static contact angle measurement changes with elapsed time. The pH values of the coatings were measured in a water solution. The durability of the CNT coated surfaces was found to be better than that of the ITO coated surfaces. The higher drying temperatures were found to produce better surfaces because of improved cohesion between the nanoparticles which resulted in improved electrical properties and improved durability of the coated surfaces.

Paper Details

Date Published: 15 February 2012
PDF: 9 pages
Proc. SPIE 8250, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI, 825004 (15 February 2012); doi: 10.1117/12.904118
Show Author Affiliations
Joung-Man Park, Gyeongsang National Univ. (Korea, Republic of)
The Univ. of Utah (United States)
Dong-Jun Kwon, Gyeongsang National Univ. (Korea, Republic of)
Zuo-Jia Wang, Gyeongsang National Univ. (Korea, Republic of)
Ga-Young Gu, Gyeongsang National Univ. (Korea, Republic of)
Lawrence DeVries, The Univ. of Utah (United States)


Published in SPIE Proceedings Vol. 8250:
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
Sonia M. García-Blanco; Rajeshuni Ramesham, Editor(s)

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