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Proceedings Paper

X-ray phase nanotomography through ptychographic coherent lensless imaging
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Paper Abstract

We describe experimental and algorithmic developments of ptychographic X-ray computed tomography, a recently reported technique that enables three-dimensional, quantitative X-ray microscopy with high sensitivity. The technique is based on the incorporation of sample rotation and tomographic reconstruction to scanning X-ray diffraction microscopy (SXDM), a robust technique for two-dimensional X-ray coherent lensless imaging.

Paper Details

Date Published: 2 November 2011
PDF: 3 pages
Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80118F (2 November 2011); doi: 10.1117/12.903688
Show Author Affiliations
Manuel Guizar-Sicairos, Paul Scherrer Institut (Switzerland)
Ana Diaz, Paul Scherrer Institut (Switzerland)
Andreas Menzel, Paul Scherrer Institut (Switzerland)
Oliver Bunk, Paul Scherrer Institut (Switzerland)


Published in SPIE Proceedings Vol. 8011:
22nd Congress of the International Commission for Optics: Light for the Development of the World
Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Rufino Díaz-Uribe; Rufino Díaz-Uribe; Rufino Díaz-Uribe, Editor(s)

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