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Proceedings Paper

Control of mode Q factor and direction-emission by metal confinement for defected circular microresonators
Author(s): Qi-Feng Yao; Jian-Dong Lin; Yue-De Yang; Yong-Zhen Huang
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Paper Abstract

Wavelength-scale defected circular microresonators with laterally confined metal layer are designed for directional emission from high Q confined modes by boundary element method (BEM), which is firstly applied to the multilayer structures. The influence of metal layer thickness on the mode filed patterns and Q factors are simulated. The results indicate that the thickness of the metal layer has a great effect on far-field emission patterns and the mode Q factors.

Paper Details

Date Published: 28 November 2011
PDF: 6 pages
Proc. SPIE 8308, Optoelectronic Materials and Devices VI, 83080N (28 November 2011); doi: 10.1117/12.903601
Show Author Affiliations
Qi-Feng Yao, Institute of Semiconductors (China)
Jian-Dong Lin, Institute of Semiconductors (China)
Yue-De Yang, Institute of Semiconductors (China)
Yong-Zhen Huang, Institute of Semiconductors (China)

Published in SPIE Proceedings Vol. 8308:
Optoelectronic Materials and Devices VI
Guang-Hua Duan, Editor(s)

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