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Proceedings Paper

Measurement of curvature and temperature using multimode interference devices
Author(s): J. R. Guzman-Sepulveda; J. G. Aguilar-Soto; M. Torres-Cisneros; O. G. Ibarra-Manzano; D. A. May-Arrioja
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Paper Abstract

In this paper we propose the fabrication, implementation, and testing of a novel fiber optic sensor based on Multimode Interference (MMI) effects for independent measurement of curvature and temperature. The development of fiber based MMI devices is relatively new and since they exhibit a band-pass filter response they can be used in different applications. The operating mechanism of our sensor is based on the self-imaging phenomena that occur in multimode fibers (MMF), which is related to the interference of the propagating modes and their accumulated phase. We demonstrate that the peak wavelength shifts with temperature variations as a result of changes in the accumulated phase through thermo-optics effects, while the intensity of the peak wavelength is reduced as the curvature increases since we start to loss higher order modes. In this way both measurements are obtained independently with a single fiber device. Compared to other fiber-optic sensors, our sensor features an extremely simple structure and fabrication process, and hence cost effectiveness.

Paper Details

Date Published: 25 October 2011
PDF: 6 pages
Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80115P (25 October 2011); doi: 10.1117/12.903448
Show Author Affiliations
J. R. Guzman-Sepulveda, Univ. de Guanajuato (Mexico)
J. G. Aguilar-Soto, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
M. Torres-Cisneros, Univ. de Guanajuato (Mexico)
O. G. Ibarra-Manzano, Univ. de Guanajuato (Mexico)
D. A. May-Arrioja, Univ. Autónoma de Tamaulipas (Mexico)


Published in SPIE Proceedings Vol. 8011:
22nd Congress of the International Commission for Optics: Light for the Development of the World
Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Rufino Díaz-Uribe; Rufino Díaz-Uribe; Rufino Díaz-Uribe, Editor(s)

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