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Proceedings Paper

Waveguide crossing characterization for silica planar lightwave circuits
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Paper Abstract

Optical waveguide crossings based on silica-on-silicon technology are investigated. The effect of crossing angle (θ) on light transmitted at through and cross-port on a sequence of waveguide crossings with angle varying from 7 to 28° is modeled and experimentally validated. Results demonstrate that structures with small footprint (θ≈9°) can achieve low crosstalk of -32 dB with high throughput, insensitivity to wavelength of operation, low polarization dependent loss of 0.6 dB, and low sensitivity to fabrication tolerances. As a result, waveguide crossings with small crossing angle present an attractive approach to reducing the overall component footprint without compromising the performance.

Paper Details

Date Published: 31 August 2011
PDF: 9 pages
Proc. SPIE 8007, Photonics North 2011, 80070P (31 August 2011); doi: 10.1117/12.902933
Show Author Affiliations
D. Celo, Communications Research Ctr. Canada (Canada)
P. Dumais, Communications Research Ctr. Canada (Canada)
S. Paquet, Communications Research Ctr. Canada (Canada)
J. Seregelyi, Communications Research Ctr. Canada (Canada)
C. Callender, Communications Research Ctr. Canada (Canada)

Published in SPIE Proceedings Vol. 8007:
Photonics North 2011
Raman Kashyap; Michel Têtu; Rafael N. Kleiman, Editor(s)

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