Share Email Print
cover

Proceedings Paper

Retrieval of diffusing surface by two-frame interferometric method with blind phase shift of a reference wave
Author(s): Leonid I. Muravsky; Arkady B. Kmet'; Taras I. Voronyak
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Two-frame interferometric method with blind phase shift of a reference wave for smooth surfaces retrieval is considered. The ability of this method to reconstruct a macrorelief of diffusing surfaces with a given roughness is studied. Computer simulations have testified the ability of reliable low-noise reconstruction of the diffusing surface macrorelief with standard deviation of the roughness heights up to λ/10 by using the developed interferogram processing algorithm. The simulations have shown that the proposed correlation approach, which is used to determine the reference wave blind phase shift, is more suitable for a diffusing surface than for a smooth one and the increase of surface roughness leads to a quadruple decrease of this error in comparison with that for the smooth surface. Experimental verification of the interferometric method performance to retrieve real diffusing surface macroreliefs with given roughness has been done by using the experimental setup based on a Twyman-Green interferometer and roughness comparison specimen. The obtained experimental results virtually have coincided with the computer simulation results that prove the performance of the considered method to retrieve not only smooth, but also diffusing surfaces.

Paper Details

Date Published: 8 September 2011
PDF: 7 pages
Proc. SPIE 8007, Photonics North 2011, 80071F (8 September 2011); doi: 10.1117/12.902885
Show Author Affiliations
Leonid I. Muravsky, Karpenko Physico-Mechanical Institute (Ukraine)
Arkady B. Kmet', Karpenko Physico-Mechanical Institute (Ukraine)
Taras I. Voronyak, Karpenko Physico-Mechanical Institute (Ukraine)


Published in SPIE Proceedings Vol. 8007:
Photonics North 2011
Raman Kashyap; Michel Têtu; Rafael N. Kleiman, Editor(s)

© SPIE. Terms of Use
Back to Top