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Proceedings Paper

Wavefront determination using the Ronchi test with synthetic wavelength
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Paper Abstract

In this work we present an efficient proposal to evaluate optical surfaces working at infrared wavelengths based on the Ronchi test and on the concept of synthetic wavelength. The implementation is performed by using a spatial modulator (XGA2 SLM) and a white Light Emitting Diode (LED) of 5mm. In order to select distinct wavelengths, different color filters are employed. Thus, for a given selected wavelength, the surface evaluation is carried out according to the method of Ronchi, registering two perpendicular interferograms for this color; the process is repeated for a second wavelength (architecture of this proposal allowed us to test the surface in more than two wavelengths). Then, an equivalent ronchigram is computationally generated with the registered data which is then analyzed in order to generate the wavefront for the correspondent synthetic wavelength. Observations of our results show that with an appropriate LED alignment and high intensity, we avoid an increase of noise due to the employment of longer wavelengths, as well as the alignment problem, often linked to the evaluation of infrared (IR) surfaces. The simplicity of the optical setup and low cost materials make this proposal applicable in the area of optical testing.

Paper Details

Date Published: 25 October 2011
PDF: 8 pages
Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80111D (25 October 2011); doi: 10.1117/12.902846
Show Author Affiliations
A. García-Arellano, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
F. S. Granados-Agustín, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
A. Cornejo-Rodriguez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)


Published in SPIE Proceedings Vol. 8011:
22nd Congress of the International Commission for Optics: Light for the Development of the World
Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Rufino Díaz-Uribe; Rufino Díaz-Uribe; Rufino Díaz-Uribe, Editor(s)

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