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Proceedings Paper

Low cost optoelectronic system for paint drying monitoring
Author(s): Ezequiel Rubinsztain; Ariel Lutenberg; Marcelo Trivi; Fernando Perez Quintián
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Paper Abstract

In previous works we reported several speckle interferometry methods applied to analyze paint drying processes. In this paper we present the development of a low cost optoelectronic system for monitoring the drying status of different types of paints. The system is composed by a laser diode, a linear CCD sensor and a microcontroller. One of the key points of the system is the algorithm that processes the speckle patterns produced by the laser beam scattered from the paint. The temporal evolution of the speckle carries information of the paint status. The proposed algorithm modifies one of its parameters to follow the speckle rate of change, allowing a real-time measurement of the drying process. The results obtained with this system are compared to the ones obtained by the method that measures the paint weight loss in time, due to the solvent evaporation, and to the results from other methods that process the temporal evolution of the speckle with different algorithms.

Paper Details

Date Published: 2 November 2011
PDF: 6 pages
Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80118U (2 November 2011); doi: 10.1117/12.902719
Show Author Affiliations
Ezequiel Rubinsztain, Univ. de Buenos Aires (Argentina)
Ariel Lutenberg, Univ. de Buenos Aires (Argentina)
Consejo Nacional de Investigaciones Científicas y Técnicas (Argentina)
Marcelo Trivi, Ctr. de Investigaciones Ópticas (Argentina)
Univ. Nacional de La Plata (Argentina)
Fernando Perez Quintián, Consejo Nacional de Investigaciones Científicas y Técnicas (Argentina)
Univ. del Comahue (Argentina)


Published in SPIE Proceedings Vol. 8011:
22nd Congress of the International Commission for Optics: Light for the Development of the World
Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Rufino Díaz-Uribe; Rufino Díaz-Uribe; Rufino Díaz-Uribe, Editor(s)

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