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Proceedings Paper

Simultaneous 1310/1550 dual-band swept laser source and fiber-based dual-band common-path swept source optical coherence tomography
Author(s): Youxin Mao; Shoude Chang; Erroll Murdock; Costel Flueraru
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Paper Abstract

A simultaneous two wavelength band swept laser source and a fiber-based dual-band common-path swept source optical coherence tomography is reported. Simultaneous 1310/1550 dual-wavelength tuning is performed by using two fiber-ring cavities with corresponding optical semiconductor amplifier as their gain mediums and two narrowband optical filters with a single dual-window polygonal scanner. Measured average output powers of 60 mW and 27 mW have been achieved for 1310 and 1550 nm bands, respectively, while the two wavelengths were swept simultaneously from 1227 nm to 1387 nm for 1310 nm band and from 1519 nm to 1581 nm for 1550 nm band at an A-scan rate of 65 kHz. A broadband 1310/1550 wavelength-division multiplexing is used for coupling two wavelengths into a common-path single-mode GRIN-lensed fiber probe to form a dual-band common-path swept-source optical coherence tomography. Simultaneous OCT imaging at 1310 and 1550 nm is achieved by using a depth ratio correction method. This technique allows potentially for in vivo endoscopic high-speed functional OCT imaging with high quality spectroscopic contrast with low computational costs. On the other hand, the common path configuration is able to reject common mode noise and potentially implement high stability quantitative phase measurements.

Paper Details

Date Published: 31 August 2011
PDF: 7 pages
Proc. SPIE 8007, Photonics North 2011, 800704 (31 August 2011); doi: 10.1117/12.902617
Show Author Affiliations
Youxin Mao, National Research Council Canada (Canada)
Shoude Chang, National Research Council Canada (Canada)
Erroll Murdock, National Research Council Canada (Canada)
Costel Flueraru, National Research Council Canada (Canada)


Published in SPIE Proceedings Vol. 8007:
Photonics North 2011
Raman Kashyap; Michel Têtu; Rafael N. Kleiman, Editor(s)

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