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Proceedings Paper

Parameters selection study of high-operating temperature MCT photoconductor detectors
Author(s): Wei Wang; Jingtong Xu; Peilu Jiang; Pengxiao Xu; Xiang-yang Li
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Paper Abstract

This paper concerned HgCdTe (MCT) infrared photoconductor detectors with high operating temperature. The near room temperature operations of detectors had advantages of light weight, less cost and convenient usage. The selection of material could greatly reduce cost caused by low performance detectors, with usage of unsuitable wafers. Many characteristic parameters were tested before the production period, material were chosen to produce the high yield detectors. Using these parameters for model construction and hypothesis testing, we could efficiently select the material most suitable for high performance detectors. Using the methods of statistical inferences, the product's fabrication management and maintenance abilities could also be greatly improved. In this paper, data of detectors were collected from detectors used in railway observation. The MCT detector was photoconductive with an 800μm× 800μm active area, which responses to radiation from 3μm to 5μm, the detector material was grown by the Bridgeman technique. The hypothesis test was a measure of how close the performance of selected fiber was to the empirical distribution, the Kolmogrov-Smirnov test, Anderson-Darling test and Chi-square goodness-of-fit test were used in this paper. The selection of material had a statistical credibility if the null hypothesis was not rejected. The reliability of detectors could also be improved with the selection of detector parameters.

Paper Details

Date Published: 8 December 2011
PDF: 8 pages
Proc. SPIE 8002, MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, 80020D (8 December 2011); doi: 10.1117/12.901974
Show Author Affiliations
Wei Wang, Shanghai Institute of Technical Physics (China)
Graduate Univ. of the CAS (China)
Jingtong Xu, Shanghai Institute of Technical Physics (China)
Peilu Jiang, Shanghai Institute of Technical Physics (China)
Pengxiao Xu, Shanghai Institute of Technical Physics (China)
Xiang-yang Li, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8002:
MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis

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