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Proceedings Paper

Simultaneous phase shifting interferometry based in a Mach Zehnder interferometer for measurement of transparent samples
Author(s): David-Ignacio Serrano-García; Noel-Ivan Toto-Arellano; Amalia Martínez-García; Juan Antonio Rayas-Álvarez; Gustavo Rodríguez-Zurita
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Paper Abstract

A Mach Zehnder (MZ) interferometer was implemented to analyze a phase object using polarization phase-shifting interferometry. The Mach Zehnder interferometer produces two beams with circular polarization of opposite rotations one respect to the other. The system is coupled to a 4-f system with phase grating in the Fourier plane, interference of the fields associated with replicated beams centered on the diffraction orders is achieved by a proper choice of the beams spacing with respect to the gratings period. The optical configuration allows obtaining n-interferograms in one shot. The configuration presented does not require micro-polarizer arrays or additional software to eliminate noise caused by vibration, as the system is stable itself and uses conventional polarizing filters. Considering the object under study a thin phase object, experimental results are presented.

Paper Details

Date Published: 21 October 2011
PDF: 6 pages
Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80110M (21 October 2011); doi: 10.1117/12.901952
Show Author Affiliations
David-Ignacio Serrano-García, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
Noel-Ivan Toto-Arellano, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
Amalia Martínez-García, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
Juan Antonio Rayas-Álvarez, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
Gustavo Rodríguez-Zurita, Benemérita Univ. Autónoma de Puebla (Mexico)


Published in SPIE Proceedings Vol. 8011:
22nd Congress of the International Commission for Optics: Light for the Development of the World
Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Rufino Díaz-Uribe; Rufino Díaz-Uribe; Rufino Díaz-Uribe, Editor(s)

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