Share Email Print
cover

Proceedings Paper

Study on transient noise of CCD camera induced by γ-ray
Author(s): Bao-jun Duan; Dong-wei Hei; Gu-zhou Song; Ji-ming Ma; Zhan-hong Zhang; Chang-cai Han; Yan Song; Ming Zhou; Lan Lei
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper, based on the mechanism of CCD camera, an event-based simulation method of γ-ray-induced transient noise was developed, which applying MCNP5 Code based on Monte Carlo methods. On the mono-energy γ-ray sources, the transient noises of two different CCD cameras have been measured at different doses (from 0.001mR to 1mR) and different incidence angles. The 60Co and 137Cs were used as the mono-energy γ-ray sources, and the Compton Scattering technique were adopted to get lower energy γ-ray sources. In order to get the pure transient noise induced by γ-ray, a method was advanced for extracting the transient noise from the image mixed the background noise. And the transient noise was characterized, including the number of noise clusters, the noise intensity spectrum and the size spectrum of noise clusters. The variation characteristics of noise have been draw from the simulation and experiment, which induced by γ-rays of different dose, or different energy or different incidence angle.

Paper Details

Date Published: 18 August 2011
PDF: 10 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81943D (18 August 2011); doi: 10.1117/12.901769
Show Author Affiliations
Bao-jun Duan, Northwest Institute of Nuclear Technology (China)
Dong-wei Hei, Northwest Institute of Nuclear Technology (China)
Gu-zhou Song, Northwest Institute of Nuclear Technology (China)
Ji-ming Ma, Northwest Institute of Nuclear Technology (China)
Zhan-hong Zhang, Northwest Institute of Nuclear Technology (China)
Chang-cai Han, Northwest Institute of Nuclear Technology (China)
Yan Song, Northwest Institute of Nuclear Technology (China)
Ming Zhou, Northwest Institute of Nuclear Technology (China)
Lan Lei, Northwest Institute of Nuclear Technology (China)


Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications

© SPIE. Terms of Use
Back to Top