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Proceedings Paper

Vector-electromagnetic scattering from metal surfaces using the infinite-slope Kirchhoff approximation
Author(s): N. C. Bruce
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Paper Abstract

One of the most popular methods for calculating the scattering of light from rough surfaces is the Kirchhoff approximation. A recent modification of the Kirchhoff approximation allows calculation of the scattering of electromagnetic radiation from rough surfaces with very high, or even infinite, slopes, which occurs frequently in, for example, imaging or testing of printed circuits or remote sensing applications. The modification involves a simple change in the way the surface normal is described which removes the explicit dependence of the resulting integral equations on the surface slope, and changing the sampling of the surface, removing the requirement of small slopes for application of the method. In this paper we present the application of the method to vector electromagnetic scattering, using the Stratton-Chu equation, from 2D rough metallic surfaces with infinite slope. The single and double scatter contributions to the total scattered intensity are calculated numerically with this new formulation. Geometrical shadowing is included by using ray tracing directly on the surface. The theoretical basis and preliminary numerical results of the application of this method to vector electromagnetic scattering from simple rough metallic surfaces (plane surfaces with single grooves or with a small number of identical grooves) with infinitely sloped structure are presented.

Paper Details

Date Published: 25 October 2011
PDF: 10 pages
Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80115T (25 October 2011); doi: 10.1117/12.901259
Show Author Affiliations
N. C. Bruce, Univ. Nacional Autónoma de México (Mexico)

Published in SPIE Proceedings Vol. 8011:
22nd Congress of the International Commission for Optics: Light for the Development of the World
Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Ramón Rodríguez-Vera; Rufino Díaz-Uribe; Rufino Díaz-Uribe; Rufino Díaz-Uribe, Editor(s)

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