Share Email Print
cover

Proceedings Paper

Phase correction for rapid en-face scanning with pulsed terahertz radiation
Author(s): Stefan Katletz; Nico Vieweg; Benedikt Scherger; Bernd Heinen; Martin Koch; Karin Wiesauer
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An enhanced measurement system for terahertz pulsed imaging is presented that is capable of effectively performing en-face and three-dimensional scans of planar and curved surfaces. The bending of the scanning surface in one direction is compensated by synchronously advancing the mechanical delay time with the deflection of a scanning mirror. The second scanning mirror for the fast scanning direction forms a telecentric system and does not exhibit phase distortion.

Paper Details

Date Published: 12 August 2011
PDF: 7 pages
Proc. SPIE 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications, 81951L (12 August 2011); doi: 10.1117/12.900994
Show Author Affiliations
Stefan Katletz, Recendt GmbH (Austria)
Nico Vieweg, Univ. of Braunschweig (Germany)
Philipps Univ. of Marburg (Germany)
Benedikt Scherger, Univ. of Braunschweig (Germany)
Philipps Univ. of Marburg (Germany)
Bernd Heinen, Univ. of Braunschweig (Germany)
Philipps Univ. of Marburg (Germany)
Martin Koch, Philipps Univ. of Marburg (Germany)
Karin Wiesauer, Recendt GmbH (Austria)


Published in SPIE Proceedings Vol. 8195:
International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications

© SPIE. Terms of Use
Back to Top