Share Email Print
cover

Proceedings Paper

Spectral response and SNR analysis of an Offner imaging spectrometer
Author(s): Zhen-zhou Wu; Zhi-hong Ma
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The Signal-to-Noise Ratio (SNR) is an important quantitative parameter for evaluating the capability of spectrometers. The noises of CMOS image sensor, stray light and radiometric distortion play important roles in the spectrometer's SNR performance. An Offner imaging spectrometer is designed and tested. By measuring the spectrometer's spectral response, its SNR is calculated by the traditional statistical method and the wavelet analysis. Both methods give similar result and can provide useful information during the spectrometer commissioning as well as performance evaluation.

Paper Details

Date Published: 18 August 2011
PDF: 9 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81942W (18 August 2011); doi: 10.1117/12.900932
Show Author Affiliations
Zhen-zhou Wu, Univ. of Science and Technology of China (China)
Zhi-hong Ma, National Engineering Research Ctr. for Information Technology in Agriculture (China)


Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications

© SPIE. Terms of Use
Back to Top