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Proceedings Paper

Coaxial transmission line for terahertz wave guiding
Author(s): Wei Xiong; Wen-feng Sun; Xin-ke Wang; Xue Wu; Yan Zhang
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Paper Abstract

We study a coaxial terahertz waveguide with low transmission loss and broad bandwidth. The coaxial transmission line is composed of an aurum line in the center, which ento-ectad covered with Teflon layer, wire-mesh, and the dielectric layer for protection. In this paper, we utilize the finite element method (FEM) to numerically analyze the transmission mode, the attenuation constant, and the bandwidth of the waveguide. The major transmission properties of the coaxial terahertz waveguide are calculated for different diameters of aurum axes and different thicknesses of dielectric layers. We also compare two waveguides with different Teflon thicknesses for getting broader transmission bandwidth. The simulation results indicate that the optimum dimension of coaxial terahertz waveguide is the aurum axes of 700μm diameter, the Teflon of 900μm thickness. With these parameters, the average attenuation constant of the waveguide can be as low as 2.44 x 10-4 dB/m in the frequency range 1.0-2.2THz. As these excellent transmission properties and simple structure of the coaxial waveguide, it can be expected that it will be widely used in terahertz wave communications and the fabrication of terahertz system integration.

Paper Details

Date Published: 12 August 2011
PDF: 6 pages
Proc. SPIE 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications, 81951H (12 August 2011); doi: 10.1117/12.900926
Show Author Affiliations
Wei Xiong, Capital Normal Univ. (China)
Wen-feng Sun, Capital Normal Univ. (China)
Xin-ke Wang, Capital Normal Univ. (China)
Xue Wu, Capital Normal Univ. (China)
Yan Zhang, Capital Normal Univ. (China)


Published in SPIE Proceedings Vol. 8195:
International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications
X.-C. Zhang; Jianquan Yao; Cunlin Zhang; Zhenzhan Wang, Editor(s)

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