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Proceedings Paper

Progress of NUV and FUV MCP-based photon-counting imaging detectors
Author(s): Yong'an Liu; Bao-sheng Zhao; Yong-lin Wei; Xiao-feng Sai; Qiu-rong Yan; Li-zhi Sheng
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Paper Abstract

In the World Space Observatory-Ultraviolet (WSO-UV) mission, the Long Slit Spectrograph (LSS) instrument will provide low resolution spectra in the range 102-320nm. Both the NUV (160-320nm) and the FUV (102-170nm) channels of LSS use microchannel plates (MCP) working in photon-counting modes as detectors. In this paper, the progress and parameters of NUV and FUV photon-counting imaging detectors were described. For the NUV detector, we developed the detector based on a sealed MCP-image intensifier which comprises input window, photocathode, MCP stack, Ge-layer and its ceramic substrate. To maximize the quantum efficiency, we adopted a Caesium Telluride (Cs2Te) photocathode, which was deposited on input window and mounted close to the MCP. For the FUV detector, because of the lower cut-off wavelength, there are no suitable window materials in this band and the open-faced design should be used to meet the requirements of the detection. Therefore, a Caesium Iodide (CsI) photocathode deposited on the input surface of the MCP was used to optimize detector efficiency. By using an existing wedge and strip anode (WSA), the imaging performance of the NUV and FUV detectors was tested respectively. Experimental results show that the quantum efficiency of Cs2Te is 12.1% (at 230nm), the spatial resolution of NUV and FUV detectors is better than 110μm, the dark count rate of NUV and FUV detectors is about 10.5- and 2.3-counts/s*cm2 respectively.

Paper Details

Date Published: 15 August 2011
PDF: 6 pages
Proc. SPIE 8196, International Symposium on Photoelectronic Detection and Imaging 2011: Space Exploration Technologies and Applications, 81961M (15 August 2011); doi: 10.1117/12.900916
Show Author Affiliations
Yong'an Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Bao-sheng Zhao, Xi'an Institute of Optics and Precision Mechanics (China)
Yong-lin Wei, Xi'an Institute of Optics and Precision Mechanics (China)
Xiao-feng Sai, Xi'an Institute of Optics and Precision Mechanics (China)
Qiu-rong Yan, Xi'an Institute of Optics and Precision Mechanics (China)
Li-zhi Sheng, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 8196:
International Symposium on Photoelectronic Detection and Imaging 2011: Space Exploration Technologies and Applications
John C. Zarnecki; Carl A. Nardell; Rong Shu; Jianfeng Yang; Yunhua Zhang, Editor(s)

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