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Proceedings Paper

Spectroscopy study of Yungang Grottoes weathered material in terahertz range
Author(s): Tian-hua Meng; Cheng-quan Yang; Yu-he Lu; Guo-zhong Zhao
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Paper Abstract

In this paper, the terahertz time domain spectroscopy (THz-TDS) technology is used to study the terahertz (THz) spectral characteristics of the Yungang Grottoes weathered material samples winch collected from No. 4, 9 and 39 these three different caves dug in different periods, A.D.520, A.D.494 and A.D. 484 years. The available effective wave band is between 0.2-2.6 THz. It is found that the transmission coefficient is high in low frequency region but low in high frequency region for all of the three kinds of samples. Experimental results also indicate that all of the samples have weak absorption in low frequency region, but the absorption coefficient increase quickly by exponential function as the frequency increasing. This character is more obvious especially for the absorption spectrum of the samples from the cave of late period. The refraction coefficient for the three kinds of samples has obvious differences in the whole THz wave band. The mean refraction coefficient of them is 1.53, 1.57 and 1.51 separately. According the results above, different periods of caves weathered samples can be identified. In addition, we can also offer the various optic constant of Yungang Grottoes samples in THz wave band for other studies work.

Paper Details

Date Published: 12 August 2011
PDF: 7 pages
Proc. SPIE 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications, 81951C (12 August 2011); doi: 10.1117/12.900825
Show Author Affiliations
Tian-hua Meng, Shanxi Datong Univ. (China)
Cheng-quan Yang, Shanxi Datong Univ. (China)
Yu-he Lu, Shanxi Datong Univ. (China)
Guo-zhong Zhao, Capital Normal Univ. (China)


Published in SPIE Proceedings Vol. 8195:
International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications
X.-C. Zhang; Jianquan Yao; Cunlin Zhang; Zhenzhan Wang, Editor(s)

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