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Proceedings Paper

Gain and noise analysis of an intensified EMCCD
Author(s): Xiaoqi Xi; Junyu Zhao; Qing Zang; Xiaofeng Han; Xingxing Dai; Jianhua Yang; Lili Zhang; Mengting Li
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Paper Abstract

In order to unite the merits of ICCD (intensified charge coupled device) and EMCCD (electron multiplying charge coupled device) for detection of the weak signal in the high resolution Thomson scattering system from strong radiation background, a second generation image intensifier, lens coupled with an EMCCD are used together as a detector. The signal photon flux is so low in the actual measurement situation that the gain of the I.I., on-chip multiplication gain of EMCCD and on-chip binning scheme might all need to be utilized to enhance the detection capability or to set lower demands for other devices. At the same time, however, these amplification processes bring unexpected noise in addition to the detector noise itself, which will further degrade the signal to noise ratio (SNR). This paper will focus on three points. Firstly, the three gain methods, including MCP gain, EM gain and binning are theoretically described. Secondly, the amount of increase in signal counts based on this detector combination is experimentally investigated at various gain settings, as well as the total noise. Finally, a gain selection disciplines aiming to obtain an optimum SNR is generalized according to the comparison between test results and theory.

Paper Details

Date Published: 18 August 2011
PDF: 4 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81942O (18 August 2011); doi: 10.1117/12.900801
Show Author Affiliations
Xiaoqi Xi, Institute of Plasma Physics (China)
Junyu Zhao, Institute of Plasma Physics (China)
Qing Zang, Institute of Plasma Physics (China)
Xiaofeng Han, Institute of Plasma Physics (China)
Xingxing Dai, Institute of Plasma Physics (China)
Jianhua Yang, Institute of Plasma Physics (China)
Lili Zhang, Institute of Plasma Physics (China)
Mengting Li, Institute of Plasma Physics (China)


Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
Makoto Ikeda; Nanjian Wu; Guangjun Zhang; Kecong Ai, Editor(s)

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