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Proceedings Paper

SCREEN photometric property detection system based on area CCD
Author(s): Fu-cai Yan; Wei Ye; Yu Xu; Chao Wang; Yu-wei Zhang
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Paper Abstract

The photometric property detection of screen display is crucial for screen display quality test. Traditional photometry detection technologies were based on photoelectric sensors such as silicon photocell, photo-electric multiplier and CdS, which can detect only some isolated points. To break the limitation of randomness, incompleteness and detection accuracy in current technologies, we designed a screen photometric detection system based on area CCD. The system consists of photometric image sensor, photometric image acquisition hardware and photometric image analyzing software. The photometric image sensor, which adopts optical lens, optical filters and area CCD, adapts its spectrum response property to fit the spectrum luminous efficiency curve V (λ) by adjusting the thickness and quantity of appropriate optical filters. photometric image acquisition hardware adopts the DSP as a core processor to drive the area CCD, to sample, acquire , process and save the image from image sensor, to transmit the image to computer. For real-time performance of transmitting, the hardware system adopts the transmission protocol of USB2.0. The uploaded image will be processed by photometric image analyzing software, and then displayed in real time with detection results. The screen photometric detection technology based on area CCD can detect specifications of the whole screen such as luminance, contrast, onoff ratio and uniformity, breaks the limitation of randomness and incompleteness in current detection technology, exactly and fully reflects the integrated display quality of the whole screen. According to the test results, the accuracy of this system has reached the accuracy level one in China.

Paper Details

Date Published: 8 September 2011
PDF: 10 pages
Proc. SPIE 8191, International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, 81911K (8 September 2011); doi: 10.1117/12.900750
Show Author Affiliations
Fu-cai Yan, Zhejiang Univ. (China)
Wei Ye, Zhejiang Univ. (China)
Yu Xu, Shanghai Baosight Software Co., Ltd. (China)
Chao Wang, Zhejiang Univ. (China)
Yu-wei Zhang, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 8191:
International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies
Yuelin Wang; Huikai Xie; Yufeng Jin, Editor(s)

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