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Proceedings Paper

Analysis of speckle-pattern interference fringes for transverse or longitudinal displacement
Author(s): Furong Huo; Jun Guo; Wensheng Wang
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Paper Abstract

What we believe to be a method for recording speckle interference fringe with electrically addressed liquid crystal display (EALCD) and CCD is presented. The speckle patterns are obtained by image plane speckle method. Two patterns of speckle interference field before and after displacement are recorded by CCD camera and stored in computer. After subtracting and taking the absolute value, the correlative fringe pattern including object's displacement information is acquired. In this paper, methods that subtract optical noise are analyzed to enhance the signal-to-noise ratio of secondary speckle fringes using double-exposure measurements on rough surfaces. The speckle pattern is processed in spatial domain and frequency domain and the obvious results are given. Compared with the results, synthesized filter is proposed in the paper. The contrast of interference pattern is increased and high SNR of the speckle fringe pattern is realized. Experimental pictures are provided in the article. The experimental result shows that the application of the method, synthesized filtering of spatial domain with frequency domain, can be used to improve the fringe contrast. The results of the experimental studies proved that the synthesized filtering is the most effective way.

Paper Details

Date Published: 18 August 2011
PDF: 6 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81942I (18 August 2011); doi: 10.1117/12.900703
Show Author Affiliations
Furong Huo, Changchun Univ. of Science and Technology (China)
Jun Guo, Changchun Univ. of Science and Technology (China)
Wensheng Wang, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
Makoto Ikeda; Nanjian Wu; Guangjun Zhang; Kecong Ai, Editor(s)

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