Share Email Print
cover

Proceedings Paper

A new type of silicon drift detector with curved surface
Author(s): Lu Cai; Min Yu; Dayu Tian; Jinyan Wang; Yufeng Jin
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A new Silicon Drift Detector (SDD) with curved surface has been proposed and analyzed by simulation. The adjacent drift cathodes punch-through problem in traditional SDD has been eliminated in the novel SDD. The potential distribution and advantages of this new SDD in comparison with the normal one are presented and discussed in this paper.

Paper Details

Date Published: 8 September 2011
PDF: 7 pages
Proc. SPIE 8191, International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, 81911E (8 September 2011); doi: 10.1117/12.900684
Show Author Affiliations
Lu Cai, Peking Univ. (China)
Min Yu, Peking Univ. (China)
Dayu Tian, Peking Univ. (China)
Jinyan Wang, Peking Univ. (China)
Yufeng Jin, Peking Univ. (China)


Published in SPIE Proceedings Vol. 8191:
International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies
Yuelin Wang; Huikai Xie; Yufeng Jin, Editor(s)

© SPIE. Terms of Use
Back to Top