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Proceedings Paper

The research of non-uniformity correction technologies for resistor array dynamic infrared scene projector
Author(s): Hong-ming Zhao; Jin-dong Fei; Hong Yu; Hui-jie Du; Yi Zhang
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Paper Abstract

The resistor array devices are commonly used to produce dynamic two dimensional infrared images in the infrared scene projectors. A non-uniformity caused by many factors is the main source of image fixed pattern noise of the projectors based on resistor array devices. A prior non-uniformity correction procedure must be done before the dynamic infrared image generation for the hardware-in-the-loop simulation test and evaluation. In this paper, the developments and details of the non-uniformity correction technologies for resistor array dynamic infrared scene projector are investigated. The research is commenced directed towards understanding the cause of spatially-distributed radiance non-uniformities of resistor array device, and the fundamental elements that underlie the non-uniformity correction technologies in dynamic infrared scene projection system.

Paper Details

Date Published: 8 September 2011
PDF: 7 pages
Proc. SPIE 8191, International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, 81911B (8 September 2011); doi: 10.1117/12.900596
Show Author Affiliations
Hong-ming Zhao, Beijing Simulation Ctr. (China)
Jin-dong Fei, Beijing Simulation Ctr. (China)
Hong Yu, Beijing Simulation Ctr. (China)
Hui-jie Du, Beijing Simulation Ctr. (China)
Yi Zhang, Beijing Simulation Ctr. (China)


Published in SPIE Proceedings Vol. 8191:
International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies
Yuelin Wang; Huikai Xie; Yufeng Jin, Editor(s)

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