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Proceedings Paper

The simple model of large scale co-ordinate measuring system and its error analysis
Author(s): Hui-min Cai; Wei Zhu; Ke-jie Li; Mei-lian Liu
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Paper Abstract

Coordinate measuring system which based on the theory of binocular stereo vision is widely used in many areas, whereas their effective measuring ranges are usually not larger than ten meters. In modern times the surveillance of large scale is used more and more in the civil and military area with the development of camera and computer technology. So based on this requirement this paper developed a new measuring model for this binocular stereo vision measuring system which is proper used in outdoor surveillance to get the 3D coordinate of the moving object. When the distance between two cameras is hundreds meters, the installation and camera calibration are quiet simple and convenient without expensive calibration apparatus and an elaborate setup or a planar pattern shown at a few different orientations or complicated camera imaging model and the parameters of math model are easy to get. After building the model of measuring system error analysis is performed to show influence of every parameter on the measuring system error. Both computer simulation and real data have been used to test the validity of our new simple measuring system model.

Paper Details

Date Published: 18 August 2011
PDF: 7 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81942B (18 August 2011); doi: 10.1117/12.900595
Show Author Affiliations
Hui-min Cai, Beijing Institute of Technology (China)
Wei Zhu, Beijing Institute of Technology (China)
Ke-jie Li, Beijing Institute of Technology (China)
Mei-lian Liu, Beijing Institute of Technology (China)
Beijing Technology and Business Univ. (China)


Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
Makoto Ikeda; Nanjian Wu; Guangjun Zhang; Kecong Ai, Editor(s)

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