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Proceedings Paper

Design considerations and detection capability verification of an imaging Thomson scattering system based on an IEMCCD
Author(s): Xiaoqi Xi; Junyu Zhao; Shinichiro Kado; Qing Zang; Xiaofeng Han; Xingxing Dai; Jianhua Yang; Mengting Li; Chunqiang Shao
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Paper Abstract

An imaging Thomson scattering system has been designed and built to perform the spatial-resolution-oriented plasma electron temperature and density measurements, which incorporates a second generation image intensifier and an EMCCD as a detection system. In general, the characteristic of weak scattering of radiation is the most concern in Thomson scattering systems. Therefore, it's quite essential for the initial system design to avoid further loss of the amount of radiant power transferred from the source to the detector, and to perform the detection capability verification based on the designed setup. This paper will focus on three points. Firstly, The key design parameters including magnification and f number of the collection lens, the diameter and NA of the fiber, the entrance and exit slit area and f number of the spectrometer are designed interactively to maximize light throughput, with also beam quality taken into account. Then, the system setup is described and the expected photon number per pulse per scattering length is calculated. Finally, from the comparison between the measured radiation photons of a standard lamp and the calculated photons based on the designed condition, with both spatial binning and EM gain performed, the capability of the detection system is verified.

Paper Details

Date Published: 18 August 2011
PDF: 5 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 819420 (18 August 2011); doi: 10.1117/12.900497
Show Author Affiliations
Xiaoqi Xi, Institute of Plasma Physics (China)
Junyu Zhao, Institute of Plasma Physics (China)
Shinichiro Kado, The Univ. of Tokyo (Japan)
Qing Zang, Institute of Plasma Physics (China)
Xiaofeng Han, Institute of Plasma Physics (China)
Xingxing Dai, Institute of Plasma Physics (China)
Jianhua Yang, Institute of Plasma Physics (China)
Mengting Li, Institute of Plasma Physics (China)
Chunqiang Shao, Institute of Plasma Physics (China)


Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
Makoto Ikeda; Nanjian Wu; Guangjun Zhang; Kecong Ai, Editor(s)

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