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Proceedings Paper

Detection technology of simultaneous imaging polarization
Author(s): Chang-Jiu Yang; Shuang Li; Zhen-Wei Qiu; Jin Hong; Yan-Li Qiao
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Paper Abstract

Detection technology of polarization imaging, which can detect the polarization state of light emitted or reflected from targets, has potential applications in space target detection and remote sensing. There are two methods for polarization state detection: time-sequential polarization detection and simultaneous polarization detection. In contrast with the well-studied time-sequential acquisition systems, the Simultaneous Imaging Polarization (SIP, one kind of simultaneous polarization detection) is a novel type of polarization imaging technology which is attracting more and more research interest. Since the polarization intensity images of 0, 45, 90 and 135 degrees from the same target can be simultaneously obtained on one detector, false polarization effects being introduced by targets' rapidly motion is avoided, which is difficult in time-sequential polarization detection system. There are seven major contributions in this paper. First, we gave a briefly introduction about the detection technology of imaging polarization. Second, the polarization detection principle of SIP detection system was presented. In the third part, the design of SIP experimental setup was showed. In the fourth part, we introduced image registration of the instrument in derail. The calibration of the instrument was shown in part five. Specifically, the depolarization of the instrument was calibrated by integrating sphere and the precision of polarization detection was tested by Variable Polarization Light Source (VPLS). The sixth part showed the polarization measurement results and their discussions. Finally, the conclusions and further improvement of this system were presented in the seventh part.

Paper Details

Date Published: 18 August 2011
PDF: 9 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81943M (18 August 2011); doi: 10.1117/12.900336
Show Author Affiliations
Chang-Jiu Yang, Anhui Institute of Optical and Fine Mechanic (China)
Shuang Li, Anhui Institute of Optical and Fine Mechanic (China)
Zhen-Wei Qiu, Anhui Institute of Optical and Fine Mechanic (China)
Jin Hong, Anhui Institute of Optical and Fine Mechanic (China)
Yan-Li Qiao, Anhui Institute of Optical and Fine Mechanic (China)


Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
Makoto Ikeda; Nanjian Wu; Guangjun Zhang; Kecong Ai, Editor(s)

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