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Proceedings Paper

The accelerated vacuum life test research of Dewar
Author(s): Yani Zhang; Xiaokun Wang; Sangen Zhu; Haimei Gong
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Paper Abstract

The Dewar package is one important way for infrared focal plane detector's application. Vacuum life is one of pivotal technologic parameter for infrared detector Dewar assembly. It is important to estimate the vacuum life of Dewar in room temperature fleetly and truly. The accelerated vacuum life test is a good way to shorten test time. The statistical and analytical way of test data to estimate distribution of Dewar vacuum life that is confirmed. Through test accelerated factor, vacuum life of Dewar in room temperature can be gained.

Paper Details

Date Published: 8 September 2011
PDF: 4 pages
Proc. SPIE 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications, 819323 (8 September 2011); doi: 10.1117/12.900284
Show Author Affiliations
Yani Zhang, Shanghai Institute of Technical Physics (China)
Xiaokun Wang, Shanghai Institute of Technical Physics (China)
Sangen Zhu, Shanghai Institute of Technical Physics (China)
Haimei Gong, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8193:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications
Jeffery J. Puschell; Junhao Chu; Haimei Gong; Jin Lu, Editor(s)

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