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Proceedings Paper

The low light level image intensifier's application in x-ray imaging
Author(s): Chunyu Yu; Lingli Kong; Junju Zhang; Shengdong Zhang
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Paper Abstract

The low light level image intensifier was usually applied in the night observation, and it has been developed and improved for a long history. While it can also be used in the x ray imaging system for its specialty in photos multiplying and conversion, so in this paper, the technology development of the low light level image intensifier was described at first and then a novel x ray image intensifier designed by our research group is introduced. The x ray intensifying screen was the x ray sensor converting the x ray into the visible light. For the visible light from the x ray image intensifier was too weak to see the image, the low light level image intensifier was used to intensify the light further. When the low light level image intensifier was selected, the novel x ray image intensifier's performance was modeled, which can given the comparison in resolution and brightness between with and without the low light level image intensifier. In conclusion, the novel x ray imaging system's performance is good enough to be applied to security checking, non-destructive testing, and industry detection.

Paper Details

Date Published: 18 August 2011
PDF: 5 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81941M (18 August 2011); doi: 10.1117/12.900232
Show Author Affiliations
Chunyu Yu, Peking Univ. Shenzhen Graduate School (China)
Nanjing Univ. of Posts and Telecommunication (China)
Lingli Kong, Shenzhen Invengo Information Technology Co., Ltd. (China)
Junju Zhang, Nanjing Univ. of Science and Technology (China)
Shengdong Zhang, Peking Univ. Shenzhen Graduate School (China)


Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
Makoto Ikeda; Nanjian Wu; Guangjun Zhang; Kecong Ai, Editor(s)

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