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Proceedings Paper

Defect printability of advanced binary film photomask
Author(s): Masato Naka; Shinji Yamaguchi; Keiko Morishita; Shingo Kanamitsu; Ryoji Yoshikawa; Hiromitsu Mashita; Takashi Hirano
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Paper Abstract

Based on an acceptable wafer critical dimension (CD) variation that takes device performance into consideration, we presented a methodology for deriving an acceptable mask defect size using defect printability [1]-[3]. The defect printability is measurable by Aerial Image Measurement System (AIMSTM) and simulated by lithography simulation without exposure. However, the defect printability of these tools is not always the same as the actual one. Therefore, the accuracy of these tools is confirmed by fabricating the programmed defect mask and exposing this mask on wafer. Advanced Binary Film (ABF) photomask has recently been studied as a substitute for the conventional MoSi phase shift mask. For ABF photomask fabrication, mask performance for process and guarantee for mask defects by repair and inspection are important. With regard to the mask performance, the ABF photomask has high performance in terms of resolution of pattern making, placement accuracy, and cleaning durability [4]. With regard to the guarantee for mask defects, it has already been confirmed that the defect on the ABF photomask is repairable for both clear and opaque defects. However, it has not been evaluated for inspection yet. Therefore, it is necessary to evaluate the defect printability, to derive the acceptable mask defect size, and to confirm the sensitivity of mask inspection tool. In this paper, the defect printability of the ABF photomask was investigated by the following process. Firstly, for opaque and clear defects, sizes and locations were designed as parameters for memory cell patterns. Secondly, the ABF programmed defect mask was fabricated and exposed. Thirdly, mask defect sizes on the ABF programmed defect mask and line CD variations on the exposed wafer were measured with CD-SEM. Finally, the defect printability was evaluated by comparing the correlation between the mask defect sizes and the wafer line CD variations with that of the AIMSTM and the lithography simulation. From these results, the defect printability of AIMSTM was almost the same as the actual one. On the other hand, the defect printability of the lithography simulation was relaxed from the actual one for the isolated defect types for both clear and opaque defects, though the defect printability for the edge defect types was almost the same. Additionally, the acceptable mask defect size based on the actual defect printability was derived and the sensitivity of the mask inspection tool (NPI-7000) was evaluated. Consequently, the sensitivity of the NPI-7000 was detectable for the derived acceptable mask defect size. Therefore, it was confirmed that the ABF photomask could be guaranteed for mask defects.

Paper Details

Date Published: 19 May 2011
PDF: 11 pages
Proc. SPIE 8081, Photomask and Next-Generation Lithography Mask Technology XVIII, 80810Q (19 May 2011); doi: 10.1117/12.899899
Show Author Affiliations
Masato Naka, Toshiba Corp. (Japan)
Shinji Yamaguchi, Toshiba Corp. (Japan)
Keiko Morishita, Toshiba Corp. (Japan)
Shingo Kanamitsu, Toshiba Corp. (Japan)
Ryoji Yoshikawa, Toshiba Corp. (Japan)
Hiromitsu Mashita, Toshiba Corp. (Japan)
Takashi Hirano, Toshiba Corp. (Japan)

Published in SPIE Proceedings Vol. 8081:
Photomask and Next-Generation Lithography Mask Technology XVIII
Toshio Konishi, Editor(s)

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