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Proceedings Paper

Micro/nano displacement measurement using sub-pixel DSCM
Author(s): Xin-zhong Li; Yu-ping Tai; Zhao-gang Nie; Li-ping Zhang; Ya-jun Wang
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Paper Abstract

A selection method of subset size in sub-pixel displacement registration is proposed. The algorithm principle of interpolation, fitting of distribution of the correlation coefficients and gradient-based methods are introduced. Using computer-simulated speckle images, their precision and efficiency depending on the subset size are studied. The optimal method and subset size are presented in various measurement ranges, which offer measuring bases for sub-pixel in DSCM.

Paper Details

Date Published: 19 August 2011
PDF: 6 pages
Proc. SPIE 8192, International Symposium on Photoelectronic Detection and Imaging 2011: Laser Sensing and Imaging; and Biological and Medical Applications of Photonics Sensing and Imaging, 819213 (19 August 2011); doi: 10.1117/12.899580
Show Author Affiliations
Xin-zhong Li, Henan Univ. of Science and Technology (China)
Yu-ping Tai, Henan Univ. of Science and Technology (China)
Zhao-gang Nie, Univ. of Electro-Communications (Japan)
Li-ping Zhang, Henan Univ. of Science and Technology (China)
Ya-jun Wang, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 8192:
International Symposium on Photoelectronic Detection and Imaging 2011: Laser Sensing and Imaging; and Biological and Medical Applications of Photonics Sensing and Imaging
Farzin Amzajerdian; Weibiao Chen; Chunqing Gao; Tianyu Xie, Editor(s)

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