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Proceedings Paper

Vision measurement method of object position in large remote area
Author(s): Meilian Liu; Kejie Li; Huimin Cai; Wei Zhu
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Paper Abstract

In order to measure accurately position of object in remote large area with vision measurement method, a special layout of vision measurement system was designed. Some calibration objects which have the same height with cameras were placed at specific position in the measurement area. By adjusting carefully the posture of cameras, those calibration objects were imaged at the same pixel row which contained the camera principal point. As a result, the master planes of cameras which were determined by the pixel row which contained the principal point and the optical axis of cameras were horizontal and coplanar. So, the u pixel coordinate of any space point was same with the one of its projection point in the xoy coordinate plane and a simplified calculation model was derived. Compared with the traditional vision measurement method, this method is simpler and more suitable for large remote area measurement. In order to verify the validity of this method, a verification experiment had been made. The experimental results show that the resolving accuracy of this model is very high, and this measurement method is very good to meet the requirement of large remote area measurement.

Paper Details

Date Published: 18 August 2011
PDF: 6 pages
Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81940X (18 August 2011); doi: 10.1117/12.899575
Show Author Affiliations
Meilian Liu, Beijing Technology and Business Univ. (China)
Beijing Institute of Technology (China)
Kejie Li, Beijing Institute of Technology (China)
Huimin Cai, Beijing Institute of Technology (China)
Wei Zhu, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 8194:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
Makoto Ikeda; Nanjian Wu; Guangjun Zhang; Kecong Ai, Editor(s)

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