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Proceedings Paper

Dislocation cell structures in CdZnTe substrates and its behavior of threading into HgCdTe LPE epilayers
Author(s): Xiaopan Cui; Weizheng Fang; Yanfeng Wei; Chuanjie Zhang; Hualian Xu; Shiwen Sun; Jianrong Yang
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Paper Abstract

Dislocation cell structures in CdZnTe substrates and its behavior of threading into HgCdTe LPE epilayers were studied. A kind of dislocation cell structure of which dislocations linearly pile up to three <1 1 0> orientations on the (1 1 1) B face of CdZnTe crystal was found. The formation of this cell structure can be demonstrated by the enrichment of the dislocations through slip during the growth or cooling process. By comparing the dislocation densities and distributions of HgCdTe LPE epilayers with it of CdZnTe substrates at the constant region using an optical microscopy system, the behavior of cell structures of CdZnTe substrates threading into HgCdTe LPE epilayers were also discussed. The results show that the stored dislocation densities at the dislocation walls can significantly affect the behavior of dislocation cell structures threading into HgCdTe LPE epilayers. Dislocation cell structures of which dislocation walls have higher stored dislocation densities can appear in constant region of HgCdTe epilayers. But the dislocations of HgCdTe epilayers growth on CdZnTe substrate with lower stored dislocation densities at the dislocation walls are almost uniformly distributed.

Paper Details

Date Published: 8 September 2011
PDF: 6 pages
Proc. SPIE 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications, 819311 (8 September 2011); doi: 10.1117/12.899525
Show Author Affiliations
Xiaopan Cui, Shanghai Institute of Technical Physics (China)
Weizheng Fang, Shanghai Institute of Technical Physics (China)
Yanfeng Wei, Shanghai Institute of Technical Physics (China)
Chuanjie Zhang, Shanghai Institute of Technical Physics (China)
Hualian Xu, Shanghai Institute of Technical Physics (China)
Shiwen Sun, Shanghai Institute of Technical Physics (China)
Jianrong Yang, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8193:
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications
Jeffery J. Puschell; Junhao Chu; Haimei Gong; Jin Lu, Editor(s)

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