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Proceedings Paper

Investigation on the third-order optical nonlinearity of CdS using 4f coherent imaging technique with phase object
Author(s): Zhong-guo Li; Chuan-xiang Yi; Shu-guang Dong; Ying-lin Song
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Paper Abstract

The third-order optical nonlinearities of semiconductor CdS are investigated using 4f nonlinear image technique with phase object at 745 nm. The measurement method is based on the 4f coherent optical processor system in Fourier optics. The nonlinear parameters of sample can be verified by numerical fitting the nonlinear image at the output plane of 4f system which obtained by a CCD camera. Using one-single-shot, the two-photon absorption coefficient β and nonlinear refraction index n2 of the CdS which arranged at the Fourier plane are determined simultaneously. The experimental results shows CdS has reverse saturable absorption and self-defocusing effect at 745 nm, indicating this material is a good candidate for future photonics applications.

Paper Details

Date Published: 19 August 2011
PDF: 6 pages
Proc. SPIE 8192, International Symposium on Photoelectronic Detection and Imaging 2011: Laser Sensing and Imaging; and Biological and Medical Applications of Photonics Sensing and Imaging, 81920V (19 August 2011); doi: 10.1117/12.899384
Show Author Affiliations
Zhong-guo Li, Soochow Univ. (China)
Chuan-xiang Yi, Soochow Univ. (China)
Shu-guang Dong, Soochow Univ. (China)
Ying-lin Song, Soochow Univ. (China)
Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 8192:
International Symposium on Photoelectronic Detection and Imaging 2011: Laser Sensing and Imaging; and Biological and Medical Applications of Photonics Sensing and Imaging
Farzin Amzajerdian; Weibiao Chen; Chunqing Gao; Tianyu Xie, Editor(s)

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