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Proceedings Paper

Transparent oxyhalide glass and glass ceramics for gamma-ray detection
Author(s): Chenlu Han; Meredith Barta; Max Dorn; Jason Nadler; Robert Rosson; Brent Wagner; Bernd Kahn; Zhitao Kang
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Paper Abstract

Nuclear radiation detection is continuously becoming more important for today's society. Conventional scintillator based gamma-ray detectors use single crystal materials such as NaI:Tl, LaBr3:Ce, which provide excellent radiation detection properties, but suffer from their environment-related fluctuation, high cost and size limitation. The incorporation of nanophosphors or quantum dots (QD) into a transparent host matrix has been studied recently as a cost-saving alternative that may solve the scalability and stability problems while still providing considerable optical performance. In this work, a new glass based detecting material with promising gamma-ray detection performance is reported. Transparent alumino-silicate glasses containing cerium-doped gadolinium halide nanocrystals were prepared by a melt-quench method followed by annealing to form nanocrystal precipitates. Samples were cast and polished for optical and radiation characterization. The preliminary results indicated a similar gamma-ray detection efficiency compared to a conventional NaI:Tl detector and a gamma-ray peak resolution of ~27% at 662 KeV from some of these samples. By controlling elemental composition and ratio of the in-situ precipitated nanoparticles, radiation detection performance is expected to be improved.

Paper Details

Date Published: 28 September 2011
PDF: 6 pages
Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 81420R (28 September 2011); doi: 10.1117/12.899353
Show Author Affiliations
Chenlu Han, Georgia Tech Research Institute (United States)
Meredith Barta, Georgia Tech Research Institute (United States)
Max Dorn, Georgia Tech Research Institute (United States)
Jason Nadler, Georgia Tech Research Institute (United States)
Robert Rosson, Georgia Tech Research Institute (United States)
Brent Wagner, Georgia Tech Research Institute (United States)
Bernd Kahn, Georgia Tech Research Institute (United States)
Zhitao Kang, Georgia Tech Research Institute (United States)
Georgia Institute of Technology (United States)


Published in SPIE Proceedings Vol. 8142:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII
Larry A. Franks; Ralph B. James; Arnold Burger, Editor(s)

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