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Proceedings Paper

Comparison of femtosecond pulse LIDT in vacuum of oxide films and the effect of a thin capping layer
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Proc. SPIE 8190, Laser-Induced Damage in Optical Materials: 2011, 81900G; doi: 10.1117/12.899270
Show Author Affiliations
Duy N. Nguyen, The Univ. of New Mexico (United States)
Luke A. Emmert, The Univ. of New Mexico (United States)
Dinesh Patel, Colorado State Univ. (United States)
Carmen S. Menoni, Colorado State Univ. (United States)
Wolfgang Rudolph, The Univ. of New Mexico (United States)


Published in SPIE Proceedings Vol. 8190:
Laser-Induced Damage in Optical Materials: 2011
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M. J. Soileau, Editor(s)

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