Share Email Print

Proceedings Paper

Third harmonic microscopy for optical material characterization
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Third harmonic (TH) imaging is inherently suited for optical material characterization. Under linearly polarized illumination the total TH signal is dominated by the signal resulting from material interfaces. For symmetry reasons, circularly polarized illumination of a medium with isotropic or cubic symmetry yields zero TH, and prevailing signals originate from localized anisotropic sample sites. Such anisotropy may result from laser induced stress, crystallinity, or birefringence. Pairing THG with complementary imaging techniques proves to be a useful diagnostic for investigating additional material characteristics. We report TH imaging of 10 nm colloidal gold nanoparticles, 100 mN nanoindentations, nascent film anisotropy, and laser induced material modification of HfO2 films both pre- and post-laser damage.

Paper Details

Date Published: 22 November 2011
PDF: 8 pages
Proc. SPIE 8190, Laser-Induced Damage in Optical Materials: 2011, 81900V (22 November 2011); doi: 10.1117/12.899265
Show Author Affiliations
R. A. Weber, The Univ. of New Mexico (United States)
C. Rodriguez, The Univ. of New Mexico (United States)
D. N. Nguyen, The Univ. of New Mexico (United States)
L. A. Emmert, The Univ. of New Mexico (United States)
W. Rudolph, The Univ. of New Mexico (United States)
D. Patel, Colorado State Univ. (United States)
C. S. Menoni, Colorado State Univ. (United States)

Published in SPIE Proceedings Vol. 8190:
Laser-Induced Damage in Optical Materials: 2011
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top