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Proceedings Paper

Characterization of optical materials and coatings for high-power NIR/VIS laser application
Author(s): Ch. Mühlig; S. Bublitz; W. Paa
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Paper Abstract

We report on the characterization of AR coatings on fused silica as well as AR coated LBO crystals used in high power NIR/VIS laser applications, mainly by means of LID (laser induced deflection) absorption measurements. The comparison of different LBO crystals shows that there are significant differences in both, the AR coating and the LBO bulk absorption. These differences are much larger at 515 nm than at 1030 nm. Results from first absorption spectroscopy measurements combining LID technique with a high power OPO laser system indicate that the coating process affects the LBO bulk absorption properties. Additionally, an emphasis is placed on the importance of the independent calibration procedure. Here, the electrical calibration is compared to two other approaches that use either doped samples or highly absorptive reference samples in combination with numerical simulations. As example, LBO crystals and fused silica are taken to show the complexity and the existing diversity of the material's photo-thermal response and its influence on choosing the appropriate measurement concept. Finally, a new concept is introduced to significantly increase the LID sensitivity for optical materials featuring a low photo-thermal response. In the case of CaF2, a sensitivity enhancement of larger than factor 6 is obtained.

Paper Details

Date Published: 22 November 2011
PDF: 10 pages
Proc. SPIE 8190, Laser-Induced Damage in Optical Materials: 2011, 819016 (22 November 2011); doi: 10.1117/12.899172
Show Author Affiliations
Ch. Mühlig, Institute of Photonic Technology (Germany)
S. Bublitz, Institute of Photonic Technology (Germany)
W. Paa, Institute of Photonic Technology (Germany)

Published in SPIE Proceedings Vol. 8190:
Laser-Induced Damage in Optical Materials: 2011
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M. J. Soileau, Editor(s)

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